Region 6 is hosting the 2014 IEEE Technology Time Machine Symposium (TTM 2014) being held October 21-22 at the Dolce Hayes Mansion in San Jose, CA.
This is the third IEEE Symposium on technologies of the future to globally predict the interplay science, technology, society, and economics may have on one another. I believe that you will find this interactive event thought provoking and insightful, giving you a platform to learn from and share ideas with a select group of industry peers.
Global experts will be presenting a 2035 vision for each of the six areas described below. Expert challengers will further examine the vision and provide a discourse that extends to participant roundtable discussions followed by an interactive readout for all to partake in. The participant conclusions reached will be edited to create a series of formal white papers through the assistance of experienced science and innovation journalists.
Future of Energy
- Visionary speaker: John D. McDonald, GE Energy Management
- Challenger: Marija Ilic, Carnegie Mellon University
- Challenger: Arun Majumdar, Stanford University
Future of Fabrication
- Visionary speaker: Henrik Christensen, Georgia Institute of Technology
- Challenger: Steve Cousins, Savioke
- Challenger: Joseph J. Salvo, GE Global Research
Future of Healthcare
- Visionary speaker: Gregory T. A. Kovacs, Stanford University Future of Humans
- Visionary speaker: Braden R. Allenby, Arizona State University
Future of Networks
- Visionary speaker: Henning Schulzrinne, Columbia University and US Federal Communications Commission
- Challenger: Seizo Onoe, NTT DoCoMo
- Challenger: Marcus Weldon, Bell Labs, Alcatel-Lucent
Future of Processing
- Visionary Speaker: Wilfried Haensch, IBM TJ Watson Research Center, Yorktown Heights, NY
- Challenger: Bob Colwell, Consultant, NAE, Former Director of DARPA MTO
- Challenger: Thomas Sterling, Indiana University, Center for Research in Extreme Scale Technologies (CREST)
To register and learn more about IEEE TTM please visit our website at http://ttm.ieee.org.
