Date: Thursday, October 25, 2012 — A live Webinar (also available later, as WebEx)
Time: 11:30 AM – 5:00 PM
Cost: No cost (live on the Internet)
Full details, and to register: www.cpmt.org/scv/meetings/cpmt1210w.html
The 4th annual IEEE Santa Clara Valley SER Workshop provides a unique forum for component manufacturers, assembly houses, and electronic system manufacturers to exchange innovative ideas and recent results on the measurement, monitoring, and control of alpha emission from packaging materials and manufacturing processes. Built on the success of our workshops held in 2009 through 2011, this year’s event continues to cover a wide range of areas and subjects critical to the control and mitigation of device soft error rates. Talks will cover the newest updates and advances for a wide range of areas including alpha emissivity measurement techniques and processes and impact on advanced low-k devices. Speakers come from equipment makers, component manufacturers, and academic institutions. This Workshop is available free, on the Internet.
Speakers:
Nelson Tam, Marvell;
Robin Gardiner, Matheson Gas;
Bharat Bhuva, Vanderbilt University;
Jeff Wilkinson, Medtronic;
Brendan McNally, XIA;
Mike Gordon, IBM;
Shah Jahinuzzaman, Intel;
Brett Clark, Honeywell;
Yi-Pin Fang, TSMC;
Sang H. Baeg, Hanyang University
